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K. G. Amberiadis
K. G. Amberiadis
Sarnoff Corporation
Semiconductor device fabrication
Dopant
Semiconductor device
Calibration
Secondary ion mass spectrometry
1
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High-Accuracy Depth Profiling in Silicon to Refine SUPREM-III Coefficients for B, P, and As
1986
C. W. Magee
K. G. Amberiadis
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Citations (4)
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