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Marc Plissonnier
Marc Plissonnier
University of Grenoble
Threshold voltage
Optoelectronics
Materials science
X-ray photoelectron spectroscopy
Transistor
3
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4
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0
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Study of an Al2O3/GaN Interface for Normally Off MOS-Channel High-Electron-Mobility Transistors Using XPS Characterization: The Impact of Wet Surface Treatment on Threshold Voltage VTH
2021
Laura Vauche
Antoine Chanuel
Eugénie Martinez
Marie-Christine Roure
Cyrille Le Royer
Stéphane Bécu
Romain Gwoziecki
Marc Plissonnier
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A Novel Insight on Interface Traps Density (Dit) Extraction in GaN-on-Si MOS-c HEMTs
2020
IEDM | International Electron Devices Meeting
William Vandendaele
Steve Martin
Marie-Anne Jaud
A. Krakovinsky
Laura Vauche
C. Le Royer
Jérôme Biscarrat
A. G. Viey
R. Gwoziecki
R. Modica
Ferdinando Iucolano
Marc Plissonnier
F. Gaillard
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