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Sung-Ho Bae
Sung-Ho Bae
SK Hynix
Electronic engineering
Chemistry
NAND gate
Flash memory
trap density
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Extraction of Interface Trap Density in the Region Between Adjacent Wordlines in NAND Flash Memory Strings
2015
IEEE Electron Device Letters
Ho-Jung Kang
Sung-Ho Bae
Min-Kyu Jeong
Sung-Min Joe
Byung-Gook Park
Jong-Ho Lee
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