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F. Barbier

NXP Semiconductors

Engineering
Electronic engineering
Electrostatic discharge
BiCMOS
Robustness (computer science)

2

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3

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An equivalent circuit model for simulation of the ggNMOS transient triggering under ESD operating conditions

2009 IECON | Conference of the Industrial Electronics Society
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Study and validation of a power-rail ESD clamp in BiCMOS process with a reduced temperature dependency of its leakage current

2004 Microelectronics Reliability
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