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B. Koerlernann
B. Koerlernann
IBM
Real-time computing
Fault indicator
Semiconductor device modeling
Stuck-at fault
Fault detection and isolation
1
Papers
16
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AC Test Quality: Beyond Transition Fault Coverage
1992
ITC | International Test Conference
Y. Aizenbud
P. Chang
B. Koerlernann
V. Iyengar
M. Leibowitz
D. Smith
B. Ros
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Citations (16)
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