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AC Test Quality: Beyond Transition Fault Coverage
AC Test Quality: Beyond Transition Fault Coverage
1992
Y. Aizenbud
P. Chang
B. Koerlernann
V. Iyengar
M. Leibowitz
D. Smith
B. Ros
Keywords:
Real-time computing
Fault indicator
Semiconductor device modeling
Stuck-at fault
Fault detection and isolation
Circuit design
Circuit extraction
Fault coverage
Electronic engineering
Automatic test pattern generation
Computer science
test quality
Correction
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