Old Web
English
Sign In
Acemap
>
authorDetail
>
Gary Guangbin Jiang
Gary Guangbin Jiang
Rudolph Technologies, Inc.
Ellipsometry
Reflectometry
Reflectivity
Laser
Wafer
1
Papers
0
Citations
0
KQI
Citation Trend
Filter By
Interval:
1900~2024
1900
2024
Author
Papers (1)
Sort By
Default
Most Recent
Most Early
Most Citation
No data
Journal
Conference
Others
Characterizing SiOx Ny ARC materials with laser ellipsometry and DUV reflectometry
2004
Gary Guangbin Jiang
Timothy Sun
Donald Pelcher
Jana Clerico
Jui-Ping Li
Yi-Ru Chen
Show All
Source
Cite
Save
Citations (0)
1