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R A Wachnik

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Gate oxide breakdown under Current Limited Constant Voltage Stress

2000 VLSIT | Symposium on VLSI Technology
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Breakdown measurements of ultra-thin SiO/sub 2/ at low voltage

2000 VLSIT | Symposium on VLSI Technology
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TERRY-2 :: a test chip for characterization of the performance of buried-channel Charge-Coupled Device (CCD) imagers

1984
- G.P. Carver
- R A Wachnik
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