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C. Hasenack
C. Hasenack
IMEC
AND gate
Substrate (chemistry)
Dielectric strength
Oxygen
Electrode
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The Influence of the Si-Substrate Characteristics on the Quality of Poly-Si and Al Gated Mos Oxides
1988
C. Hasenack
Marc Heyns
R. Falster
R. De Keersmaecker
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