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Takahisa Furuhashi
Takahisa Furuhashi
Tokyo Institute of Technology
Analytical chemistry
Scanning tunneling microscope
Crystallography
Physics
Chemistry
4
Papers
7
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Analysis of Sidewall Damage Layer in Low-k Film Using the Interline Dielectric Capacitance Measurements
2011
Japanese Journal of Applied Physics
Takahisa Furuhashi
N. Nakanishi
Masahiro Matsumoto
Shigenori Kido
Masakazu Okada
Yuichi Kawano
Yukinori Hirose
Masahiko Fujisawa
Koyu Asai
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Barrier height imaging of Si(1 1 1)3 × 1–Ag reconstructed surfaces
2006
Applied Surface Science
Takahisa Furuhashi
Yoshifumi Oshima
Hiroyuki Hirayama
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Atomic Arrangement in a Triple-period A-type Ordered GaInP Layer Grown with Sb Addition during Metal Organic Vapor Phase Epitaxy Observed by Cross Sectional Scanning Tunneling Microscope
2005
Japanese Journal of Applied Physics
Shunsuke Ohkouchi
Takahisa Furuhashi
Akiko Gomyo
Toshinari Ichihashi
Chung-Chi Hsu
Tohru Suzuki
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Cross-sectional scanning tunneling microscopy observation of atomic arrangement in triple period-A type ordered AlInAs alloy
2005
Applied Surface Science
Shunsuke Ohkouchi
Takahisa Furuhashi
Akiko Gomyo
Kikuo Makita
Tohru Suzuki
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Citations (5)
1