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Mikko Rossi

University of Jyväskylä

23

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166

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Heavy-ion induced single event effects and latent damages in SiC power MOSFETs

2022 Microelectronics Reliability
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SEU characterization of commercial and custom-designed SRAMs based on 90 nm technology and below

2020 REDW | Radiation Effects Data Workshop
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Results on radiation hardness of black silicon induced junction photodetectors from proton and electron radiation

2020 Nuclear Instruments & Methods in Physics Research Section A-accelerators Spectrometers Detectors and Associated Equipment
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Energy loss and straggling of MeV Si ions in gases

2017 Nuclear Instruments & Methods in Physics Research Section B-beam Interactions With Materials and Atoms
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Determination of electronic stopping powers of 0.05–1 MeV/u 131Xe ions in C-, Ni- and Au-absorbers with calorimetric low temperature detectors

2017 Nuclear Instruments & Methods in Physics Research Section B-beam Interactions With Materials and Atoms
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SEGR in SiO${}_2$ –Si$_3$ N$_4$ Stacks

2014 IEEE Transactions on Nuclear Science
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Secondary electron flight times and tracks in the carbon foil time pick-up detector

2014 Nuclear Instruments & Methods in Physics Research Section B-beam Interactions With Materials and Atoms
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Time-of-flight - Energy spectrometer for elemental depth profiling - Jyväskylä design

2014 Nuclear Instruments & Methods in Physics Research Section B-beam Interactions With Materials and Atoms
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Low Energy Protons at RADEF - Application to Advanced eSRAMs

2014 REDW | Radiation Effects Data Workshop
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Semi-Empirical Model for SEGR Prediction

2013 IEEE Transactions on Nuclear Science
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Citations (9)