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I. S. Cho
I. S. Cho
Samsung
Materials science
Metallurgy
Leakage (electronics)
Electronic engineering
Optoelectronics
3
Papers
6
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0
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Effect of Ni Surface Finish on Half Etched Cu on Solder Joint Reliability
2007
ECTC | Electronic Components and Technology Conference
S. W. Shin
Pyoung-Wan Kim
H. J. Woo
Eun-Chul Ahn
I. S. Cho
T.G. Chung
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Manufacturable embedded CMOS 6T-SRAM technology with high-k gate dielectric device for system-on-chip applications
2002
IEDM | International Electron Devices Meeting
Chang-bong Oh
Hee Soo Kang
H.J. Ryu
M.H. Oh
Hyung-Suk Jung
Yong-Seok Kim
J.H. He
Nae-in Lee
K.H. Cho
Deok-Hyung Lee
T.H. Yang
I. S. Cho
Hyon-Goo Kang
Young-Wug Kim
Kwang Pyuk Suh
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Citations (6)
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