Old Web
English
Sign In
Acemap
>
authorDetail
>
Guillaume Jenicot
Guillaume Jenicot
ON Semiconductor
Engineering
Electronic engineering
Power semiconductor device
Safe operating area
Dielectric strength
3
Papers
15
Citations
0.00
KQI
Citation Trend
Filter By
Interval:
1900~2024
1900
2024
Author
Papers (3)
Sort By
Default
Most Recent
Most Early
Most Citation
No data
Journal
Conference
Others
IEC vs. HBM: How to optimize on-chip protections to handle both requirements?
2009
Electrical Overstress/Electrostatic Discharge Symposium
Julien Lebon
Guillaume Jenicot
Peter Moens
D. Pogany
Sergey Bychikhin
Show All
Source
Cite
Save
Citations (4)
Safe Operating Area Considerations for Integrated Trench-Based Power Devices
2009
IEEE Transactions on Device and Materials Reliability
Peter Moens
Jaume Roig
B. Desoete
Filip Bauwens
Angela Rinaldi
Piet Vanmeerbeek
Guillaume Jenicot
Marnix Tack
Show All
Source
Cite
Save
Citations (4)
TLP Characterization of large gate width devices
2007
Microelectronics Reliability
P. Coppens
Guillaume Jenicot
H. Casier
F. De Pestel
F. Depuydt
Nick Martens
Peter Moens
Show All
Source
Cite
Save
Citations (7)
1