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L. Toyoshiba
L. Toyoshiba
Dielectric strength
Gate oxide
Capacitor
Electrical breakdown
Breakdown voltage
1
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4
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Comparison Of A Rapid Wafer Level Gate Oxide Test To Tddb
1992
A.-R. Barakji
John T. Yue
Nguyen D. Bui
L. Toyoshiba
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Citations (4)
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