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Comparison Of A Rapid Wafer Level Gate Oxide Test To Tddb
Comparison Of A Rapid Wafer Level Gate Oxide Test To Tddb
1992
A.-R. Barakji
John T. Yue
Nguyen D. Bui
L. Toyoshiba
Keywords:
Dielectric strength
Gate oxide
Capacitor
Electrical breakdown
Breakdown voltage
Wafer
Time-dependent gate oxide breakdown
Analytical chemistry
Electronic engineering
Materials science
Electrical engineering
electric breakdown
Optoelectronics
Correction
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