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Jung-Do Lee
Jung-Do Lee
Samsung
Thin film
Physics
Analytical chemistry
Waveguide (optics)
Surface roughness
2
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78
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Comparative structural and electrical analysis of NiO and Ti doped NiO as materials for resistance random access memory
2008
Journal of Applied Physics
M. J. Lee
Young-soo Park
Seung-Eon Ahn
Bo-Soo Kang
Chang-Bum Lee
Ki-Hwan Kim
Wenxu Xianyu
In-kyeong Yoo
Jung-Do Lee
Seok-Jae Chung
Yoon-Chang Kim
Choongman Lee
K. N. Choi
K. S. Chung
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Citations (47)
Formation of plasma induced surface damage in silica glass etching for optical waveguides
2004
Journal of Applied Physics
Duk-Yong Choi
Jung-Do Lee
Duck-Hyun Kim
Sun-Tae Jung
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Citations (31)
1