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Eelco de Koning
Eelco de Koning
NXP Semiconductors
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Thin film
Resistor
BiCMOS
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Design and evaluation of an integrated thin film resistor matching test structure
2015
ICMTS | International Conference on Microelectronic Test Structures
Hans Tuinhout
Nicole Wils
Paul Huiskamp
Eelco de Koning
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