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Paul Huiskamp
Paul Huiskamp
NXP Semiconductors
Electronic engineering
Engineering
Electrical engineering
bipolar process
system level
4
Papers
14
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Design of an On-Board ESD Protection for USB3 Applications
2016
IEEE Transactions on Device and Materials Reliability
Guido Notermans
Hans-Martin Ritter
Joachim Utzig
Steffen Holland
Zhihao Pan
Jennifer Schuett
Jochen Wynants
Paul Huiskamp
Wim Peters
Burkhard Laue
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Citations (5)
Design and evaluation of an integrated thin film resistor matching test structure
2015
ICMTS | International Conference on Microelectronic Test Structures
Hans Tuinhout
Nicole Wils
Paul Huiskamp
Eelco de Koning
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Citations (2)
An off-chip ESD protection for high-speed interfaces
2015
EOS/ESD | Electrical Overstress/Electrostatic Discharge Symposium
Guido Notermans
Hans-Martin Ritter
Joachim Utzig
Steffen Holland
Zhihao Pan
Jochen Wynants
Paul Huiskamp
Wim Peters
Burkhard Laue
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Citations (6)
A novel degradation mechanism in SiCr-O based thin film resistors under temperature and current stress
2012
IRPS | International Reliability Physics Symposium
Yuan Li
Paul Huiskamp
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Citations (1)
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