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W. Hourani
W. Hourani
Analytical chemistry
Auger
Spectroscopy
Sputtering
Materials science
4
Papers
13
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3D Auger quantitative depth profiling of individual nanoscaled III–V heterostructures
2016
Journal of Electron Spectroscopy and Related Phenomena
W. Hourani
V. Gorbenko
Jean-Paul Barnes
Cyril Guedj
R. Cipro
J Moeyaert
S. David
F. Bassani
T. Baron
E. Martinez
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Citations (2)
Chemical depth profiling and 3D reconstruction of III–V heterostructures selectively grown on non-planar Si substrates by MOCVD
2015
Physica Status Solidi-rapid Research Letters
V. Gorbenko
M. Veillerot
Adeline Grenier
G. Audoit
W. Hourani
Eugénie Martinez
R. Cipro
M. Martin
S. David
X. Bao
F. Bassani
T. Baron
Jean-Paul Barnes
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Citations (4)
Nanoscale elemental quantification in heterostructured SiGe nanowires
2015
Nanoscale
W. Hourani
Priyanka Periwal
F. Bassani
T. Baron
G. Patriarche
Eugénie Martinez
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Citations (6)
Nanoscale Surface and Sub-Surface Chemical Analysis of SiGe Nanowires
2014
Microscopy and Microanalysis
W. Hourani
Eugénie Martinez
Priyanka Periwal
G. Patriarche
F. Bassani
J-M. Fabbri
Thierry Baron
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Citations (1)
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