Old Web
English
Sign In
Acemap
>
authorDetail
>
Michael I. Current
Michael I. Current
Applied Materials
Beam (structure)
Ion implantation
Integrated circuit
Wafer
Current density
1
Papers
0
Citations
0
KQI
Citation Trend
Filter By
Interval:
1900~2024
1900
2024
Author
Papers (1)
Sort By
Default
Most Recent
Most Early
Most Citation
No data
Journal
Conference
Others
Plasma model for charging damage
1994
M. C. Vella
W. Lukaszek
Michael I. Current
Nicholas H. Tripsas
Show All
Source
Cite
Save
Citations (0)
1