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Manish Sharma

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5

Papers

3

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Improving Diagnosis Resolution with Population Level Statistical Diagnosis

2021
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A supervised machine learning application in volume diagnosis

2019 ETS | European Test Symposium
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Reversible Scan Based Diagnostic Patterns

2019 VLSI-DAT | International Symposium on VLSI Design, Automation and Test
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Yield Learning for Complex FinFET Defect Mechanisms Based on Volume Scan Diagnosis Results

2019 ASMC | Advanced Semiconductor Manufacturing Conference
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Innovative Practices on Software and Hardware based Silicon Debug/Fault Isolation.

2019 VTS | VLSI Test Symposium
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