Old Web
English
Sign In
Acemap
>
authorDetail
>
Neerja Bawaskar
Neerja Bawaskar
GlobalFoundries
Engineering
Electronic engineering
Manufacturing engineering
Deconvolution
Root cause
5
Papers
2
Citations
0
KQI
Citation Trend
Filter By
Interval:
1900~2024
1900
2024
Author
Papers (5)
Sort By
Default
Most Recent
Most Early
Most Citation
No data
Journal
Conference
Others
Fault Isolation using Layout Pattern Analysis
2020
Atul Chittora
Neerja Bawaskar
Shobhit Malik
Monisa Ramesh Babu
Fadi Batarseh
Janam Bakshi
Davide Pacifico
Shenghua Song
Show All
Source
Cite
Save
Citations (0)
A supervised machine learning application in volume diagnosis
2019
ETS | European Test Symposium
Yue Tian
Gaurav Veda
Wu-Tung Cheng
Manish Sharma
Huaxing Tang
Neerja Bawaskar
Sudhakar M. Reddy
Show All
Source
Cite
Save
Citations (1)
Yield Learning for Complex FinFET Defect Mechanisms Based on Volume Scan Diagnosis Results
2019
ASMC | Advanced Semiconductor Manufacturing Conference
Huaxing Tang
Manish Sharma
Wu-Tung Cheng
Gaurav Veda
Douglas Gehringer
Matt Knowles
Jayant D'Souza
Kannan Sekar
Neerja Bawaskar
Yan Pan
Show All
Source
Cite
Save
Citations (1)
Early Testable Addressable Logic (ETAL) Test Structure: Showcasing the use of an Alternate Logic Yield Learning Test Structure for Technology Development
2019
ASMC | Advanced Semiconductor Manufacturing Conference
Ishtiaq Ahsan
Daniel Greenslit
Bill Evans
Toni Laaksonen
Tarl Gordon
Zhigang Song
Yandong Liu
John Masnik
Frank Barth
Shahrukh Khan
Joerg Winkler
Kannan Sekar
Neerja Bawaskar
Steve Crown
Kan Zhang
Martin O'tool
Teng-Yin Lin
Mark Lagus
DK Sohn
Show All
Source
Cite
Save
Citations (0)
Pylon: Towards an integrated customizable volume diagnosis infrastructure
2016
ITC | International Test Conference
Yan Pan
Rao Desineni
Kannan Sekar
Atul Chittora
Sherwin Fernandes
Neerja Bawaskar
John M. Carulli
Show All
Source
Cite
Save
Citations (0)
1