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C. Beer
C. Beer
University of Warwick
Oxide
Electron mobility
MOSFET
Analytical chemistry
Materials science
4
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41
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Low temperature effective mobility measurements and modelling of high-k gated Si n-MOS and p-MOS devices
2010
Stephen M. Thomas
M. J. Prest
T. E. Whall
C. Beer
D. R. Leadley
E. H. C. Parker
J.R. Watling
R.J.P. Lander
Georgios Vellianitis
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The role of interface states in the low temperature mobility of hafnium-oxide gated Ge-pMOSFETs and the effect of a hydrogen anneal
2008
ULIS | International Conference on Ultimate Integration on Silicon
C. Beer
Terry E. Whall
E. H. C. Parker
D. R. Leadley
B. De Jaeger
Gareth Nicholas
Paul Zimmerman
Marc Meuris
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Anomalous Ge diffusion effects during Ge-condensation
2008
ULIS | International Conference on Ultimate Integration on Silicon
C. Beer
Terry E. Whall
R. J. H. Morris
E. H. C. Parker
D. R. Leadley
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High Mobility Strained Ge pMOSFETs With High- $\kappa$ /Metal Gate
2007
IEEE Electron Device Letters
Gareth Nicholas
Timothy John Grasby
D. J. F. Fulgoni
C. Beer
J. Parsons
M. Meuris
M. Heyns
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Citations (41)
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