Old Web
English
Sign In
Acemap
>
authorDetail
>
Binod Kumar G. Nair
Binod Kumar G. Nair
GlobalFoundries
Critical area
Reliability engineering
Failure mode and effects analysis
Computer science
Electronic engineering
3
Papers
1
Citations
0
KQI
Citation Trend
Filter By
Interval:
1900~2024
1900
2024
Author
Papers (3)
Sort By
Default
Most Recent
Most Early
Most Citation
No data
Journal
Conference
Others
A Novel Foundry Yield Model Using Critical Area Analysis
2021
IEEE Transactions on Semiconductor Manufacturing
Xiaoyuan Qi
Uwe Paul Schroeder
Aaron Sinnott
Binod Kumar G. Nair
Akif Sultan
Sriram Madhavan
Jac Condella
Jonathan Fales
Jeffrey E. Nelson
Frank E. Gennari
Ya-Chieh Lai
Rwik Sengupta
Philippe Hurat
Show All
Source
Cite
Save
Citations (0)
Fast, high-capacity critical area analysis (CAA) with advanced FINFET defectivity calculation
2021
Xiaoyuan Qi
Atul Chittora
Aaron Sinnott
Binod Kumar G. Nair
Shobhit Malik
Jeffrey E. Nelson
Jac Condella
Jonathan R. Fales
Rwik Sengupta
Ya-Chieh Lai
Frank E. Gennari
Philippe Hurat
Show All
Source
Cite
Save
Citations (0)
Incorporating Core-to-Core Correlation to Improve Partially Good Yield Models
2019
IEEE Transactions on Semiconductor Manufacturing
Xiaoyuan Qi
Raymond J. Rosner
Thomas Joseph
Brian Walsh
Aaron Sinnott
Binod Kumar G. Nair
Show All
Source
Cite
Save
Citations (1)
1