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Aaron Sinnott
Aaron Sinnott
GlobalFoundries
Computer science
Electronic engineering
Reliability engineering
Static random-access memory
Data modeling
5
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4
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0
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A Novel Foundry Yield Model Using Critical Area Analysis
2021
IEEE Transactions on Semiconductor Manufacturing
Xiaoyuan Qi
Uwe Paul Schroeder
Aaron Sinnott
Binod Kumar G. Nair
Akif Sultan
Sriram Madhavan
Jac Condella
Jonathan Fales
Jeffrey E. Nelson
Frank E. Gennari
Ya-Chieh Lai
Rwik Sengupta
Philippe Hurat
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Fast, high-capacity critical area analysis (CAA) with advanced FINFET defectivity calculation
2021
Xiaoyuan Qi
Atul Chittora
Aaron Sinnott
Binod Kumar G. Nair
Shobhit Malik
Jeffrey E. Nelson
Jac Condella
Jonathan R. Fales
Rwik Sengupta
Ya-Chieh Lai
Frank E. Gennari
Philippe Hurat
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Incorporating Core-to-Core Correlation to Improve Partially Good Yield Models
2019
IEEE Transactions on Semiconductor Manufacturing
Xiaoyuan Qi
Raymond J. Rosner
Thomas Joseph
Brian Walsh
Aaron Sinnott
Binod Kumar G. Nair
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A Simplified Yield Model for SRAM Repair in Advanced Technology
2018
IEEE Transactions on Very Large Scale Integration Systems
Xiaoyuan Qi
Raymond J. Rosner
Jack M. Higman
Rick Mewhirter
Aaron Sinnott
Binod Kumar Gopalakrishn Nair
Ishtiaq Ahsan
Mark Lagus
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Successful yield ramp using product test, scan and memory diagnosis
2014
ASMC | Advanced Semiconductor Manufacturing Conference
Venkatesan Muthumalai
David Iverson
Aaron Sinnott
Rao Desineni
Ritesh Turakhia
Thomas Berndt
Nancy Bell
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