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Ruichao Zhu
Ruichao Zhu
University of New Mexico
Polarizer
Optics
Materials science
Metrology
Nanoimprint lithography
7
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11
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Scatterometry for nanoimprint lithography
2016
Journal of Vacuum Science & Technology. B. Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena
Ruichao Zhu
Steven R. J. Brueck
Noel M. Dawson
Tito Busani
Praveen Joseph
Shrawan Singhal
S. V. Sreenivasan
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Metrology, Inspection, and Process Control for Microlithography XXIX
2015
Ruichao Zhu
Alexander Munoz
S. R. J. Brueck
Shrawan Singhanl
S. V. Sreenivasan
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Metrology of 50nm HP wire-grid polarizer
2015
Ruichao Zhu
Alexander Munoz
S. R. J. Brueck
Shrawan Singhanl
Sidlgata V. Sreenivasan
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Integration of Block-Copolymer with Nano-Imprint Lithography: Pushing the Boundaries of Emerging Nano-Patterning Technology.
2012
Geoffrey L. Brennecka
David Bruce Burckel
Chu-Yeu Peter Yang
Matthew C. George
Jack Skinner
Charles A. Steinhaus
Steven R. J. Brueck
Ruichao Zhu
Alex K. Raub
Paul F. Nealey
Juan J. de Pablo
Chi-Chun Liu
Darin Q. Pike
Lance Williamson
Brandon L. Peters
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