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Terence P. Ma
Terence P. Ma
Yale University
Gate dielectric
Leakage (electronics)
Micrometre
Field-effect transistor
CMOS
1
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5
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High quality ultra-thin (1.5 nm) TiO2-Si3N 4 gate dielectric for deep sub-micron CMOS technology
1999
International Electron Devices Meeting
Xin Guo
Xiewen Wang
Zhijiong J. Luo
Terence P. Ma
Takashi Tamagawa
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