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J.L. Wert

Boeing Phantom Works

34

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Team Update on North American Proton Facilities for Radiation Testing

2016
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Evaluation and Application of U.S. Medical Proton Facilities for Single Event Effects Test

2015 IEEE Transactions on Nuclear Science
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Low-Energy Proton Testing Using the Boeing Radiation Effects Laboratory 2.2 MeV Dynamitron

2012 REDW | Radiation Effects Data Workshop
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Predicting the Single-Event Error Rate of a Radiation Hardened by Design Microprocessor

2011 IEEE Transactions on Nuclear Science
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Heavy Ion, High-Energy, and Low-Energy Proton SEE Sensitivity of 90-nm RHBD SRAMs

2010 IEEE Transactions on Nuclear Science
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First record of single event upset on the ground, Cray-1 computer memory at Los Alamos in 1976

2010 IEEE Transactions on Nuclear Science
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Angular Dependence of Single Event Sensitivity in Hardened Flip/Flop Designs

2008 IEEE Transactions on Nuclear Science
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Enhanced TID Susceptibility in Sub-100 nm Bulk CMOS I/O Transistors and Circuits

2007 IEEE Transactions on Nuclear Science
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Propagating SET Characterization Technique for Digital CMOS Libraries

2006 IEEE Transactions on Nuclear Science
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The effects of device metal interconnect overlayers on SEE testing

2005 REDW | Radiation Effects Data Workshop
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