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Barry Meaker

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Total Ionizing Dose Characterization of an 8-bit 200-MSps Switched-Capacitor Pipeline A-to-D Converter in 32nm SOI CMOS

2016 REDW | Radiation Effects Data Workshop
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Predicting the Single-Event Error Rate of a Radiation Hardened by Design Microprocessor

2011 IEEE Transactions on Nuclear Science
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Heavy Ion, High-Energy, and Low-Energy Proton SEE Sensitivity of 90-nm RHBD SRAMs

2010 IEEE Transactions on Nuclear Science
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