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Jeff Siddiqui
Jeff Siddiqui
Reliability engineering
Computer science
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Automotive engineering
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Product reliability and qualifications for high consequence/low volume integrated circuits: Discussion group, Oct. 10, 2017
2017
IIRW | International Integrated Reliability Workshop
Gaddi Haase
Jean Yang-Scharlotta
Jeff Siddiqui
Charles LaRow
Scott Pozder
Peter Paliwoda
Matthew Hogan
James May
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Package reliability: How can we use ideas/methods from semiconductor reliability in package reliability?
2017
IIRW | International Integrated Reliability Workshop
Tom Kopley
Scott K. Pozder
Martin Anselm
Patrick Justison
Matt Ring
Karsten Beckmann
Jeff Siddiqui
Gaddi Haase
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