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Charles LaRow
Charles LaRow
GlobalFoundries
Computer science
Reliability engineering
Electronic engineering
Dielectric strength
Time-dependent gate oxide breakdown
6
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Product reliability and qualifications for high consequence/low volume integrated circuits: Discussion group, Oct. 10, 2017
2017
IIRW | International Integrated Reliability Workshop
Gaddi Haase
Jean Yang-Scharlotta
Jeff Siddiqui
Charles LaRow
Scott Pozder
Peter Paliwoda
Matthew Hogan
James May
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2D materials in electronics devices
2017
IIRW | International Integrated Reliability Workshop
Chadwin D. Young
Matt Ring
J. R. Lloyd
Avyaya Jayanthinarasimham
Charles LaRow
Alexander L. Shluger
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Impact of e-SiGe S/D processes on FinFET PFET TDDB reliability
2017
EDTM | IEEE Electron Devices Technology and Manufacturing Conference
R. Ranjan
Suresh Uppal
H. Yu
B. Parameshwaran
Tanya Nigam
Andreas Kerber
Charles LaRow
Mahadeva Iyer Natarajan
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Fast TDDB for early reliability monitoring
2016
IIRW | International Integrated Reliability Workshop
Charles LaRow
Y. Liu
Zakariae Chbili
A. Gondal
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