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Harakawa H
Harakawa H
Organic chemistry
Chemistry
CMOS
Reliability (semiconductor)
Materials science
2
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0.25μm CoSi2 salicide CMOS technology thermally stable up to 1,000°C with high TDDB reliability.
1997
VLSIT | Symposium on VLSI Technology
Tatsuya Ohguro
S Nakamura
Morifuji E
Takashi Yoshitomi
Toyota Morimoto
Harakawa H
Momose H S
Katsumata Y
Hiroshi Iwai
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新規抗アレルギー剤 II 新6,11‐ジヒドロジベンズ[b,e]‐オキセピン‐カルボン酸誘導体の合成と活性
1991
Chemical & Pharmaceutical Bulletin
Kumazawa T
Ohshima E
Harakawa H
Sato H
Obase H
Oiji Y
Ishii A
Ishii H
Ohmori K
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