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Masanao Munekane

4

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Samples shift method in charged particle beam and charged particle beam and specimen for transmission electron microscope

2008
- Masanao Munekane
- Junichi Tashiro
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3D Structure Fabrication by FIB Milling and Deposition

2006
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By semiconductor silicon process technology educated sample carrier

2006
- Kouji Iwasaki
- Masanao Munekane
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