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Masahiro Kiyohara
Masahiro Kiyohara
Materials science
Analytical chemistry
Ion beam
Gallium
Focused ion beam
5
Papers
32
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High Contrast SEM Observation of Semiconductor Dopant Profile using TripleBeam® System
2017
Microscopy and Microanalysis
Yuka Aizawa
Takahiro Sato
Takeshi Sunaoshi
Hiroaki Matsumoto
Toshihide Agemura
Shota Torikawa
Ikuko Nakatani
Masahiro Kiyohara
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3D Structure Fabrication by FIB Milling and Deposition
2006
Toshiaki Fujii
Koji Iwasaki
Masanao Munekane
Yo Yamamoto
Toshitada Takeuchi
Masakatsu Hasuda
Yutaka Ikku
Hiromi Tashiro
Tatsuya Asahata
Masahiro Kiyohara
Takashi Kaito
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Automated High-quality TEM Sample Preparation
2006
Microscopy and Microanalysis
Yo Yamamoto
Tatsuya Asahata
Masahiro Kiyohara
Hidekazu Suzuki
H Takahashi
Yutaka Ikku
Makoto Sato
H. Matsumura
Koji Iwasaki
Toshiaki Fujii
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A nanofactory by focused ion beam
2005
Journal of Micromechanics and Microengineering
Toshiaki Fujii
Koji Iwasaki
Masanao Munekane
Toshitada Takeuchi
Masakatsu Hasuda
Tatsuya Asahata
Masahiro Kiyohara
Toshiharu Kogure
Yukimitsu Kijima
Takashi Kaito
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Vacancy-Type Defects in SrTiO 3 Probed by a Monoenergetic Positron Beam
2004
Materials Science Forum
Akira Uedono
Masahiro Kiyohara
Kazuo Shimoyama
Yusuke Matsunaga
Nobuyuki Yasui
Kikuo Yamabe
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