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Ken W. Marr

Micron Technology

Electronic engineering
Logic gate
Parametric statistics
Electronic circuit
Leakage (electronics)

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Addressable test structure design enabling parallel testing of reliability devices

2018 ICMTS | International Conference on Microelectronic Test Structures
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Discrete Test Structure Device Degradation Analysis and Correlation to NAND Flash Circuit Operation

2010 WMED | Workshop on Microelectronics and Electron Devices
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