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Praveen Vaidyanathan

Micron Technology

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Discrete Test Structure Device Degradation Analysis and Correlation to NAND Flash Circuit Operation

2010 WMED | Workshop on Microelectronics and Electron Devices
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Using TCAD, Response Surface Model and Monte Carlo Methods to Model Processes and Reduce Device Variation

2009 SISPAD | International Conference on Simulation of Semiconductor Processes and Devices
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Small-Signal Analysis andModeling ofAsymmetric Source/Drain Parasitic Resistances forDRAM Access Transistors inLow-Power Applications

2006 International Conference on Simulation of Semiconductor Processes and Devices
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Time-dependent dielectric breakdown of a recessed channel DRAM access device

2006 WMED | Workshop on Microelectronics and Electron Devices
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