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Blanka Detlefs

IMEC

10

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A new generation of x-ray spectrometry UHV instruments at the SR facilities BESSY II, ELETTRA and SOLEIL

2016
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Reference‐free, depth‐dependent characterization of nanolayers and gradient systems with advanced grazing incidence X‐ray fluorescence analysis

2015 Physica Status Solidi (a)
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Reference-free, depth-dependent characterization of nanoscaled materials using a combined grazing incidence X-ray fluorescence and X-ray reflectometry approach

2015
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Reference-free, depth dependent characterization of nanoscale materials by combined X-ray reflectivity and grazing incidence X-ray fluorescence analysis

2014
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Quantification of high-K nanolayers for semiconductor applications using synchrotron radiation and calibrated instrumentation

2014
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Characterization of High-k Nanolayers by Grazing Incidence X-ray Spectrometry

2014 Materials
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Characterization of High-k Nanolayers by Grazing Incidence

2014
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