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Reference-free , in-depth characterization of nanoscaled systems with advanced grazing incidence X-ray fluorescence analysis
Reference-free , in-depth characterization of nanoscaled systems with advanced grazing incidence X-ray fluorescence analysis
2014
Philipp Hoenicke
Matthias Mueller
Blanka Detlefs
Claudia Fleischmann
Burkhard Beckhoff
Keywords:
Grazing
Analytical chemistry
X-ray fluorescence
Materials science
reference free
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