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Yun-Seong Kang
Yun-Seong Kang
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Electron
Amorphous solid
Analytical chemistry
Chemistry
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2
Papers
4
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0
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Severe hump phenomenon induced by increased charge trapping and suppression of electron capture effect in amorphous In-Ga-Zn-O thin-film transistors under unipolar pulsed drain bias with static positive gate bias stress
2020
Solid-state Electronics
Yongjo Kim
Tae-Kyoung Ha
Yong-Jung Cho
Yun-Seong Kang
SangHee Yu
GwangTae Kim
Hun Jeong
Jeong Ki Park
Ohyun Kim
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Citations (2)
Defect-creation effects on abnormal on-current under drain bias illumination stress in a-IGZO thin-film transistors
2020
Solid-state Electronics
Tae-Kyoung Ha
Yongjo Kim
Yong-Jung Cho
Yun-Seong Kang
SangHee Yu
GwangTae Kim
Hoon Jeong
Jeong Ki Park
Ohyun Kim
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Citations (2)
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