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Yongjo Kim
Yongjo Kim
Pohang University of Science and Technology
Amorphous solid
Analytical chemistry
Electron
Thin-film transistor
Ionization
4
Papers
4
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0
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Abnormal Double-Hump Phenomenon in Amorphous In-Ga-Zn-O Thin-Film Transistor under Positive Gate Bias Temperature Stress
2020
Solid-state Electronics
Yongjo Kim
Tae-Kyoung Ha
SangHee Yu
GwangTae Kim
Hoon Jeong
JeongKi Park
Ohyun Kim
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Severe hump phenomenon induced by increased charge trapping and suppression of electron capture effect in amorphous In-Ga-Zn-O thin-film transistors under unipolar pulsed drain bias with static positive gate bias stress
2020
Solid-state Electronics
Yongjo Kim
Tae-Kyoung Ha
Yong-Jung Cho
Yun-Seong Kang
SangHee Yu
GwangTae Kim
Hun Jeong
Jeong Ki Park
Ohyun Kim
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Citations (2)
Abnormal threshold voltage shift by the effect of H2O during negative bias stress in amorphous InGaZnO Thin Film Transistors
2020
Solid-state Electronics
Tae-Kyoung Ha
Yongjo Kim
SangHee Yu
GwangTae Kim
Hoon Jeong
JeongKi Park
Ohyun Kim
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Defect-creation effects on abnormal on-current under drain bias illumination stress in a-IGZO thin-film transistors
2020
Solid-state Electronics
Tae-Kyoung Ha
Yongjo Kim
Yong-Jung Cho
Yun-Seong Kang
SangHee Yu
GwangTae Kim
Hoon Jeong
Jeong Ki Park
Ohyun Kim
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Citations (2)
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