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Yabuuchi Michitarou
Yabuuchi Michitarou
Electronic engineering
Process variation
Plasma
Ring oscillator
Oscillation
5
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Circuit Simulation Method Using Bimodal Defect-Centric Model of Random Telegraph Noise on 40 nm SiON Process
2016
Yabuuchi Michitarou
Oshima Azusa
Komawaki Takuya
Kobayashi Kazutoshi
Kishida Ryo
Furuta Jun
Weckx Pieter
Kaczer Ben
Matsumoto Takashi
Onodera Hidetoshi
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Methodology for Reduction of Timing Margin by Considering Correlation between Process Variation and BTI
2015
Technical report of IEICE. VLD
Yabuuchi Michitarou
Kobayashi Kazutoshi
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Prediction Model for Process Variation and BTI-Induced Degradation by Measurement Data on FPGA
2014
IEICE technical report. Computer systems
Yabuuchi Michitarou
Kobayashi Kazutoshi
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Initial Frequency Degradation on Ring Oscillators in 65-nm SOTB Process Caused by Plasma-Induced Damage
2014
Technical report of IEICE. SDM
Oshima Azusa
Kishida Ryo
Yabuuchi Michitarou
Kobayashi Kazutoshi
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Evaluations of Variations on Ring Oscillators from Plasma Induced Damage in Bulk and SOTB Processes
2013
Kishida Ryo
Yabuuchi Michitarou
Oshima Azusa
Kobayashi Kazutoshi
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