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Circuit Simulation Method Using Bimodal Defect-Centric Model of Random Telegraph Noise on 40 nm SiON Process
Circuit Simulation Method Using Bimodal Defect-Centric Model of Random Telegraph Noise on 40 nm SiON Process
2016
Yabuuchi Michitarou
Oshima Azusa
Komawaki Takuya
Kobayashi Kazutoshi
Kishida Ryo
Furuta Jun
Weckx Pieter
Kaczer Ben
Matsumoto Takashi
Onodera Hidetoshi
Keywords:
Circuit design
Electronic engineering
Electrical engineering
Engineering
Correction
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