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Y.C. See
Y.C. See
Katholieke Universiteit Leuven
MOSFET
Electronic engineering
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Physics
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2
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57
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Ge n-channel FinFET with optimized gate stack and contacts
2014
IEDM | International Electron Devices Meeting
M.J.H. van Dal
B. Duriez
Georgios Vellianitis
Gerben Doornbos
Richard Kenneth Oxland
M. Holland
Aryan Afzalian
Y.C. See
Matthias Passlack
Carlos H. Diaz
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Citations (21)
Scaled p-channel Ge FinFET with optimized gate stack and record performance integrated on 300mm Si wafers
2013
IEDM | International Electron Devices Meeting
B. Duriez
Georgios Vellianitis
M.J.H. van Dal
Gerben Doornbos
Richard Kenneth Oxland
Krishna Kumar Bhuwalka
M. Holland
Y. S. Chang
C. H. Hsieh
K. M. Yin
Y.C. See
Matthias Passlack
C. H. Diaz
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Citations (36)
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