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David T. Hodul

Varian Associates

12

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191

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Simulation of Uniformity and Lifetime Effects in Collimated Sputtering

1995 MRS Proceedings
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Wavelength-specific pyrometry as a temperature measurement tool

1992 IEEE Transactions on Electron Devices
- Michelangelo Delfino
- David T. Hodul
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Synchrotron X-Ray Topographic Study of the Behavior of Defects in High Carbon-Content Si Wafers during RTP

1991 MRS Proceedings
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Synchrotron X-ray topographic studies of the changes in defect microstructure induced by rapid thermal processing of single-crystal silicon wafers

1990 Materials Letters
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Partial substitution of /sup 18/O in YBa/sub 2/Cu/sub 3/O/sub 7/: Investigations of inhomogeneities and their effect on /ital T//sub c/

1989
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Partial substitution of Â¹â¸O in YBaâCuâOâ: Investigations of inhomogeneities and their effect on /ital T//sub c/

1989
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Partial substitution of 18 O in YBa 2 Cu 3 O 7 : Investigations of inhomogeneities and their effect on T c

1989 Journal of Materials Research
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The structure and electronic properties of the solid solutions (ZrxTi1 − x)1 + yS2

1986 Journal of Solid State Chemistry
- David T. Hodul
- Angelica M. Stacy
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Raman spectra of IVB and VIB transition metal disulfides using laser energies near the absorption edges

1985 Journal of Physics and Chemistry of Solids
- Angelica M. Stacy
- David T. Hodul
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The effects of nonstoichiometry and electron concentration on the properties of LixHfTe2−y

1985 Journal of Physics and Chemistry of Solids
- David T. Hodul
- Angelica M. Stacy
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Citations (9)