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X. Y. Zhao
X. Y. Zhao
Shanghai Normal University
Dielectric
Ellipsometry
Sputter deposition
Thin film
Permittivity
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Infrared dielectric properties of BaTiO3 ultrathin films
2008
S. J. Liu
X. Y. Zhao
G. Pan
G. F. Su
Z. M. Huang
J.-H. Chu
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