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Joo-Hyun Jeong

Samsung

7

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25

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한·중·일 청소년의 식품소비 추이 비교분석

2009
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Effects of Parasitic Capacitance, External Resistance, and Local Stress on the RF Performance of the Transistors Fabricated by Standard 65-nm CMOS Technologies

2008 IEEE Transactions on Electron Devices
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DEA를 이용한 미곡종합처리장(RPC)의 효율성 분석

2008
- Taeho Lee
- Joo-Hyun Jeong
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Properties of RFLDMOS with low resistive substrate for handset power applications

2005 RFIC | Radio Frequency Integrated Circuits Symposium
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