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Neeraj Kapoor
Neeraj Kapoor
STMicroelectronics
Electromigration
Electronic engineering
Integrated circuit design
CMOS
Design flow
2
Papers
34
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Managing SRAM reliability from bitcell to library level
2010
IRPS | International Reliability Physics Symposium
V. Huard
Remy Chevallier
C. Parthasarathy
Anand Kumar Mishra
Natalia Ruiz-Amador
Flore Persin
Vincent Robert
Alejandro Chimeno
E. Pion
N. Planes
D. Ney
F. Cacho
Neeraj Kapoor
Vishal Kulshrestha
Sanjeev Chopra
Nicolas Vialle
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Citations (34)
Method and reliability of the measuring device of a circuit integrated
2010
Remy Chevallier
V. Huard
Neeraj Kapoor
Xavier Fedierspiel
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1