Old Web
English
Sign In
Acemap
>
authorDetail
>
Yingdi Liu
Yingdi Liu
Siemens
Computer science
Built-in self-test
Code coverage
System testing
Computer hardware
3
Papers
5
Citations
0
KQI
Citation Trend
Filter By
Interval:
1900~2024
1900
2024
Author
Papers (3)
Sort By
Default
Most Recent
Most Early
Most Citation
No data
Journal
Conference
Others
X-Tolerant Compactor maXpress for In-System Test Applications With Observation Scan
2021
IEEE Transactions on Very Large Scale Integration Systems
Yingdi Liu
Sylwester Milewski
Grzegorz Mrugalski
Nilanjan Mukherjee
Janusz Rajski
Jerzy Tyszer
Bartosz Wlodarczak
Show All
Source
Cite
Save
Citations (1)
X-Tolerant Tunable Compactor for In-System Test
2020
ITC | International Test Conference
Yingdi Liu
Sylwester Milewski
Grzegorz Mrugalski
Nilanjan Mukherje
Janusz Rajski
Jerzy Tyszer
Bartosz Włodarczak
Show All
Source
Cite
Save
Citations (1)
Test Time and Area Optimized BrST Scheme for Automotive ICs
2019
ITC | International Test Conference
Nilanjan Mukherjee
Jerzy Tyszer
Daniel Tille
Mahendar Sapati
Yingdi Liu
Jeffrey Mayer
Sylwester Milewski
Elham Moghaddam
Janusz Rajski
Jedrzej Solecki
Show All
Source
Cite
Save
Citations (3)
1