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M. Fregolent
M. Fregolent
University of Padua
Materials science
Gallium
Optoelectronics
Trapping
Depletion region
2
Papers
1
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0
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Review on the degradation of GaN-based lateral power transistors
2021
C. De Santi
Matteo Buffolo
Isabella Rossetto
T. Bordignon
E. Brusaterra
Alessandro Caria
F. Chiocchetta
D. Favero
M. Fregolent
F. Masin
Nicola Modolo
A. Nardo
F. Piva
Fabiana Rampazzo
C. Sharma
Nicola Trivellin
G. Zhan
Matteo Meneghini
Enrico Zanoni
Gaudenzio Meneghesso
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Carrier capture kinetics, deep levels, and isolation properties of β-Ga2O3 Schottky-barrier diodes damaged by nitrogen implantation
2020
Applied Physics Letters
C. De Santi
M. Fregolent
Matteo Buffolo
Man Hoi Wong
Masataka Higashiwaki
Gaudenzio Meneghesso
Enrico Zanoni
Matteo Meneghini
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