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Cynthia Whiteside
Cynthia Whiteside
IBM
Manufacturing engineering
Operations management
Engineering
Photolithography
IBM
3
Papers
7
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Defect reduction through Lean methodology
2010
Kathleen G. Purdy
Louis Kindt
Jim Densmore
Craig Benson
Nancy Zhou
John M. Leonard
Cynthia Whiteside
Robert Nolan
David Shanks
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Cost of yield
2003
ASMC | Advanced Semiconductor Manufacturing Conference
Daniel N. Maynard
D.S. Kerr
Cynthia Whiteside
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Effects of photoresist foreshortening on an advanced Ti/AlCu/Ti metallurgy and W interconnect technology
1998
ASMC | Advanced Semiconductor Manufacturing Conference
Cynthia Whiteside
Matt Rutten
Henry Trombley
Howard S. Landis
Michelle Boltz
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